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Characterization of Pedot: Pss Functionalized By Dimethyl Sulfoxide and Triton X-100 and Tio2 Nanoparticles

Abstract

Anisa Yaseen, A Vázquez-López, D Maestre, J Ramírez-Castellanos, E S Marstein, S Z Karazhanov and A Cremades

In this work poly (3, 4-ethylenedioxythiophene)/poly(styrenesulfonate) (PEDOT:PSS) dispersed in solvent (5wt.% Dimethyl sulfoxide DMSO & 0.1wt.% Triton X-100) has been studied in pure form and when functionallized with TiO2 nanoparticles. A preliminary characterization of bare PEDOT:PSS and romarchite TiO2 nanoparticles synthesized by hydrolysis were firstly carried out. PEDOT:PSS was deposited on n(FZ)-Si by spin coating method. The influence of a piranha pre-treatment on the Si surface has been evaluated in this work, as well as the effects due to the presence of TiO2 nanoparticles in the polymer. After achieving good adhesion and passivation of Si surface, the heterostructure has been characterized systematically by means of Raman spectroscopy using a He-Cd (λ = 325 nm) laser as excitation source, atomic force microscopy (AFM), scanning electron microscopy (SEM) and photoluminescence (PL) spectra, and PL image. Spatial homogeneity of the film composition on surface has been achieved. Uniform defect distribution and presence of charged defects, material quality and vibrational structure have been studied. PEDOT:PSS thin film was obtained through solution process which involves adding a solvent additive and/or conducting post treatment at low temperatures. The film was obtained by static spin coating method on a n-type silicon substrate, followed by annealing of the film at 120oC for 10-15 min. The achieved PEDOT:PSS layer thickness was around to be ~100 nm with the average surface roughness of 3:5±0:5 nm measured by AFM. Charge carrier lifetime measured by PL-machine was found out to be between 264-375 µs. By four probe measurements, the sheet resistance was found out to be 338 ?/sq.

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